E1 performance parameters

Overview

This section describes the performance monitoring parameters that are applicable to E1 signals.

Monitored parameters

The following table lists the E1 line performance parameters that Alcatel-Lucent 1665 DMXtend monitors, including the default and ranges for the 15-minute and 1-day (24-hour) registers.

Table 5-12: SONET E1 performance parameters

Facility	Measured Provisionable Parameter	15-Min		1-Day
Facility	Measured Provisionable Parameter	Default	Range¹	Default	Range¹
E1 Line	Errored Seconds (ES-L)	65	0–900	648	0–65535
E1 Line	Severely Errored Seconds (SES-L)	10	0–900	100	0–65535
E1 Path	Background Block Errors - Path, Path Far End (BBE-P, BBE-PFE)	13290	0–16383	3865	0–1048575
	Errored Seconds - Path, Path Far End (ES-P, ES-PFE)	65	0–900	648	0–65535
	Severely Errored Seconds - Path, Path Far End (SES-P, SES-PFE)	10	0–900	100	0–65535
	Unavailable Seconds - Path, Path Far End (UAS-P, UAS-PFE)	10	0–900	10	0–65535

Notes:

When an individual performance monitoring parameter threshold is provisioned as zero (0), TCA reporting for the affected parameter is disabled.

E1 line parameters

Alcatel-Lucent 1665 DMXtend monitors the following near end SONET line parameters on incoming (from the local cross-connect) E1 signals. The parameters are measured at the input of the DS1/E1 circuit pack on the E1 line side (also referred to as facility, customer terminal, or STSX-1 side).

Errored seconds (ES-L)

The Near-End Line Errored Seconds (ESL) parameter for each SONET Line is monitored. The Near-End CVL parameter increments once for every second that contains at least one BIP error detected at the Line layer (at any point during the second), or an AIS-L defect was present. The Far-End Line Errored Seconds parameter for each SONET line is monitored. The Far-End ESL parameter increments once for each second where one or more Far-End Line layer BIP errors are detected as reported by the REI-L indication of the line overhead or an RDI-L defect is detected.

Severely errored seconds (SES-L)

The Near-End Line Severely Errored Seconds (SESL) parameter for each SONET Line is monitored. The Near-End SESL parameter increments once for every second that contains at least K BIP errors detected at the Line layer (at any point during the second), or an AIS-L defect was present. The value of K is hard-coded, see table 7 for a list of the values.

The Far-End Line Severely Errored Seconds parameter for each SONET line is monitored. The Far-End SESL parameter increments once for each second where K or more Line layer BIP errors are detected as reported by the REI-L indication of the line overhead or an RDI-L defect is detected. The integer value for K is set by standards and is selectable

EC-1 line PM report

Use the Performance → Reports → EC1 Line command to obtain the EC-1 Line PM Report. For more information about the EC-1 line parameters and the Performance → Reports → EC1 Line command, see the WaveStar^® CIT online help.

E1 path parameters

Alcatel-Lucent 1665 DMXtend monitors the following near end path parameters on incoming (from the local cross-connect) E1 signals. The parameters are measured at the input of the DS1/E1 circuit pack on the E1 line side (also referred to as facility, customer terminal, or STSX-1 side).

Background block errors (BBE-P)

The Near-End E1 Background Block Errors (BBE-P) parameter for each E1 Path is monitored. The number of Near-End BBE-Ps in a one second period is equal to the Near-End EBC if the second is not a Near-End SES. Otherwise, the BBE-P is set to zero for that second.

The Far-End E1 Background Block Errors (BBE-P) parameter for each E1 Path is monitored. The number of Far-End E1 BBE-Ps in a one second period is equal to the Far-End EBC if the second is not a Far-End SESP and there is not a Near-End Defect. Otherwise, the BBE-P is set to zero for that second.

The BBE-P parameter applies only to the CRC-4 MultiFrame format.

Errored seconds (ES-P)

The Near-End E1 Path Errored Seconds (ESP) parameter for each E1 signal is monitored. The ESP parameter applies to both FAS format and CRC-4 MultiFrame format.

For the FAS format, the ESP parameter increments once for each one second interval containing one or more errored FAS anomalies, or one or more defects.

For the CRC-4 MultiFrame format, the ESP parameter increments once for each one second interval containing CRC-4 block errors, or one or more defects.

The Far-End E1 Path Errored Seconds (ESP) parameter for each E1 path is monitored. The Far-End ESP parameter applies to both FAS format and CRC-4 MultiFrame format.

For the FAS format, the Far-End ESP parameter increments once for each one second interval containing one or more RDI defects and there is not a Near-End Defect.

For the CRC-4 MultiFrame format, the Far-End ES parameter increments once for each one second interval containing one or more RDI defects, or a Far-End Block Error (FEBE), and there is not a Near-End Defect.

If the A-Bit equals 1 in four or more double frames, then there is an RDI defect.

Severely errored seconds (SES-P)

The Near-End E1 Path Severely Errored Seconds (SESP) parameter for each E1 path is monitored. The SES parameter applies to both FAS frame and CRC-4 MultiFrame formats.

For the FAS format, the SES parameter increments once for each one second interval containing 28 or more frame bit errors, or one or more defects.

For the CRC-4 MultiFrame format, the SES parameter increments once for each one second interval containing 300 or more CRC-4 block errors, or one or more defects.

The Far-End E1 Path Severely Errored Seconds (SESP) parameter for each E1 path is monitored. The Far-End SESP parameter applies to both FAS format and CRC-4 MultiFrame format.

For the FAS format, the Far-End SESP parameter increments once for each one second interval containing one or more RDI defects and there is not a Near-End Defect.

For the CRC-4 MultiFrame format, the Far-END ESP parameter increments once for each one second interval containing one or more RDI defects, or 300 or more FEBEs and there is not a Near-End Defect.

If the A-Bit equals 1 in four or more double frames, then there is an RDI defect.

FEBE is based on the E-bit (ITU-T G.704).

Unavailable seconds (UAS-P)

The Near-End E1 Path UAS Seconds (UASP) parameter for each E1 path is monitored. The UAS parameter is a count of 1 second intervals for which the E1 path is unavailable at the onset of 10 contiguous SESs. The 10 SESs are included in the unavailable time. Once unavailable, the UAS continues to increment once for each second until ten consecutive seconds without SES are detected. The 10 seconds without SESs are excluded from the unavailable time. The UAS parameter applies to both FAS frame and CRC-4 MultiFrame formats.

The Far-End E1 Path UAS Seconds (UASP) parameter for each E1 path is monitored. The Far-End UASP parameter is a count of 1 second intervals for which the E1 path is unavailable at the onset of 10 contiguous SESs. The 10 SESs are included in the unavailable time. Once unavailable, the Far-End UASP continues to increment once for each second until ten consecutive seconds without SES are detected. The 10 seconds without SESs are excluded from the unavailable time. The Far-End UASP parameter applies to both FAS frame and CRC-4 MultiFrame formats.