Procedure 14-32: Change test access mode of internal test access session

- Overview

Important!

The network element must be equipped with Very Large Fabric (VLF) circuit packs in the Main slots to support internal test access sessions.

Use this procedure to change the test access mode of an existing internal test access session between MONE and SPLT(A or E).

To change the test access mode of an existing external test access session, refer to Procedure 14-24: Change test access mode of external test access session.

- Privilege level

You must log in as either a Privileged, General, or Maintenance user to complete this procedure.

Restrictions

The following restrictions apply:

  • A new internal test access session can be created only in the MONE test access mode initially.

  • The network element must be equipped with Very Large Fabric (VLF) circuit packs in the Main slots to support internal test access sessions.

  • The VLF circuit packs in the Main slots have 12 STS-1 signals routed to test signal generators and 12 STS-1 signals routed to test signal detectors. For STS-3 test access sessions, 3 STS-1 generators/detectors on the STS-3 boundary (1, 4, 7, 10) must be available.

DANGER 

NOTICE

Service-disruption hazard

Service interruptions can occur on tributaries if they are accidentally tested. Service interruptions may also occur on unintended tributaries if unsupported test access configurations are attempted.

Recheck the address (AID) of the tributary(ies) being tested. Do not attempt to establish unsupported test access sessions.

- Before you begin

Prior to performing this procedure:

  1. Refer to Before you begin and Required equipment in this chapter.

  2. Refer to Electrostatic discharge in Chapter 1, Safety.

  3. Obtain the work instructions for this procedure.

  4. Verify that the work instructions identify the test access session number and the changes to be performed.

Steps

Complete the following steps to change the test access mode of an existing internal test access session.

 
1

From the System View menu select Fault → Analysis → Test Access.

Result:

The Test Access Wizard appears.


2

Click Modify an existing test access session's mode and Next.


3

Important!

The test access mode changes are limited between MONE and SPLT(A or E).

Follow the directions in the remaining Test Access Wizard screens to perform the required changes to the internal test access session.


4

Important!

A test access session remains in effect until deleted.

Verify the test access session parameters, then click Finish at the end of the Test Access Wizard screens.

Result:

A dialog box appears asking you to confirm executing this command. Click Yes and the Test Access Wizard appears.


5

Click View existing test access sessions and Next.

Result:

A list of existing test access sessions appears.


6

Verify that the required test access session was changed and click Close.


End of steps

November 2011Copyright © 2011 Alcatel-Lucent. All rights reserved.