Procedure 14-24: Change test access mode of external test access session

- Overview

Use this procedure to change the test access mode of an existing external test access session among the following groups of test access modes:

  • MONE, SPLTE

  • MONEF, SPLTEF

To change an existing internal test access session, refer to Procedure 14-32: Change test access mode of internal test access session.

- Privilege level

You must log in as either a Privileged, General, or Maintenance user to complete this procedure.

Restrictions

The following restrictions apply to test access.

  • A new external test access session can be created only in the MONE or MONEF test access mode initially.

  • If the Main slots are equipped with LNW40/LNW302/LNW601 OC-3 or LNW38/LNW51/LNW382 OC-12 OLIU circuit packs, the VT1.5 test access cross-connection capacity is limited because of the small VT switch fabric. Therefore, it is recommended that you use only the MONE or SPLTE mode and avoid using ports on the LNW6, LNW7, LNW39, LNW111, and LNW112 circuit packs for the E Tributary, F Tributary, and Test Access Tributaries.

DANGER 

NOTICE

Service-disruption hazard

Service interruptions can occur on tributaries if they are accidentally tested. Service interruptions may also occur on unintended tributaries if unsupported test access configurations are attempted.

Recheck the address (AID) of the tributary(ies) being tested and the test access tributary(ies). Do not attempt to establish unsupported test access sessions.

- Before you begin

Prior to performing this procedure:

  1. Refer to Before you begin and Required equipment in this chapter.

  2. Refer to Laser safety and Electrostatic discharge in Chapter 1, Safety.

  3. Obtain the work instructions for this procedure.

  4. Verify that the work instructions identify the test access mode, test access rate, and the assigned addresses (AIDs) of the tributary(ies) to be tested and the test access tributary(ies).

Steps

Complete the following steps to change the test access mode of an existing external test access session.

 
1

From the System View menu select Fault → Analysis → Test Access.

Result:

The Test Access Wizard appears.


2

Click Modify an existing test access session's mode and Next.


3

Important!

The test access mode changes are limited between MONE and SPLTE or MONEF and SPLTEF.

Follow the directions in the remaining Test Access Wizard screens to change the test access mode of the required test access session.


4

Important!

A test access session remains in effect until deleted.

Verify the test access session parameters, then click Finish at the end of the Test Access Wizard screens.

Result:

A dialog box appears asking you to confirm executing this command. Click Yes and the Test Access Wizard appears.


5

Click View existing test access sessions and Next.

Result:

A list of existing test access sessions appears.


6

Verify that the required test access session was changed and click Close.


End of steps

November 2011Copyright © 2011 Alcatel-Lucent. All rights reserved.